NON-LAMBERTIAN SURFACE INSPECTION SYSTEM FOR LINE SCAN CROSS REFERENCE TO RELATED APPLICATION

A non-Lambertian surface inspection system for line scan is proposed. Such a system includes: a surface inspection part including a frame module provided with a curved mounting hole formed on at least one of one surface and the other surface thereof and a photographing hole formed at an upper end th...

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Bibliographische Detailangaben

Hauptverfasser:	YOON, Yeo Hak, PARK, Su Yeol, KWEON, In Soo, CHUN, Ung Jun
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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