TESTING OF LED DEVICES DURING PICK AND PLACE OPERATIONS

A pick and place LED testing apparatus, comprising: a test station operative in use to power a group of LEDs; a bondhead operative in use to pick said group of LEDs from a source wafer and place said group of LEDs on said test station for testing; and an optical sensor operative in use to measure an...

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Hauptverfasser:	LEE, Shun Yan, WONG, Sai Kit, YUEN, Chi Wah, MAK, Ka Yee, WIDDOWSON, Gary Peter
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
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creator	LEE, Shun Yan WONG, Sai Kit YUEN, Chi Wah MAK, Ka Yee WIDDOWSON, Gary Peter
description	A pick and place LED testing apparatus, comprising: a test station operative in use to power a group of LEDs; a bondhead operative in use to pick said group of LEDs from a source wafer and place said group of LEDs on said test station for testing; and an optical sensor operative in use to measure an optical characteristic of said group of LEDs when tested, wherein at least a portion of said bondhead is translucent to provide an optical path from said group of LEDs to said optical sensor.
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
title	TESTING OF LED DEVICES DURING PICK AND PLACE OPERATIONS
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