Sacrificial Capping Layer For Passivation Using Plasma-Based Implant Process

An apparatus and method of processing a workpiece is disclosed, where a sacrificial capping layer is created on a top surface of a workpiece. That workpiece is then exposed to an ion implantation process, where select species are used to passivate the workpiece. While the implant process is ongoing,...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Lee, Jun Seok, Mittal, Deven Raj, Bhosle, Vikram M, Bateman, Nicholas P.T, Miller, Timothy J
Format: Patent
Sprache:eng
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