REMAINING SERVICE LIFE PREDICTION FOR SWITCHES
Events relevant for the service life are recorded for calculating the remaining service life of a switch. Events relevant for the service life are evaluated with respect to the frequency of their occurrence. The possibility of a future occurrence for the service life of relevant events is taken into...
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creator | MOOSBURGER, Thomas STROBL, Matthias FANDERL, Alexander ERVEN, Wolfgang BOERZSOENYI, Christoph SCHWINN, Bernd REISINGER, Juergen WIDMANN, Stefan |
description | Events relevant for the service life are recorded for calculating the remaining service life of a switch. Events relevant for the service life are evaluated with respect to the frequency of their occurrence. The possibility of a future occurrence for the service life of relevant events is taken into account or not taken into account in accordance with the frequency of their occurrence for calculating the remaining service life. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022004181A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022004181A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022004181A13</originalsourceid><addsrcrecordid>eNrjZNALcvV19PTz9HNXCHYNCvN0dlXw8XRzVQgIcnXxdA7x9PdTcPMPUggO9wxx9nAN5mFgTUvMKU7lhdLcDMpurkAZ3dSC_PjU4oLE5NS81JL40GAjAyMjAwMTQwtDR0Nj4lQBAHtSJp4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>REMAINING SERVICE LIFE PREDICTION FOR SWITCHES</title><source>esp@cenet</source><creator>MOOSBURGER, Thomas ; STROBL, Matthias ; FANDERL, Alexander ; ERVEN, Wolfgang ; BOERZSOENYI, Christoph ; SCHWINN, Bernd ; REISINGER, Juergen ; WIDMANN, Stefan</creator><creatorcontrib>MOOSBURGER, Thomas ; STROBL, Matthias ; FANDERL, Alexander ; ERVEN, Wolfgang ; BOERZSOENYI, Christoph ; SCHWINN, Bernd ; REISINGER, Juergen ; WIDMANN, Stefan</creatorcontrib><description>Events relevant for the service life are recorded for calculating the remaining service life of a switch. Events relevant for the service life are evaluated with respect to the frequency of their occurrence. The possibility of a future occurrence for the service life of relevant events is taken into account or not taken into account in accordance with the frequency of their occurrence for calculating the remaining service life.</description><language>eng</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220106&DB=EPODOC&CC=US&NR=2022004181A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220106&DB=EPODOC&CC=US&NR=2022004181A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MOOSBURGER, Thomas</creatorcontrib><creatorcontrib>STROBL, Matthias</creatorcontrib><creatorcontrib>FANDERL, Alexander</creatorcontrib><creatorcontrib>ERVEN, Wolfgang</creatorcontrib><creatorcontrib>BOERZSOENYI, Christoph</creatorcontrib><creatorcontrib>SCHWINN, Bernd</creatorcontrib><creatorcontrib>REISINGER, Juergen</creatorcontrib><creatorcontrib>WIDMANN, Stefan</creatorcontrib><title>REMAINING SERVICE LIFE PREDICTION FOR SWITCHES</title><description>Events relevant for the service life are recorded for calculating the remaining service life of a switch. Events relevant for the service life are evaluated with respect to the frequency of their occurrence. The possibility of a future occurrence for the service life of relevant events is taken into account or not taken into account in accordance with the frequency of their occurrence for calculating the remaining service life.</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALcvV19PTz9HNXCHYNCvN0dlXw8XRzVQgIcnXxdA7x9PdTcPMPUggO9wxx9nAN5mFgTUvMKU7lhdLcDMpurkAZ3dSC_PjU4oLE5NS81JL40GAjAyMjAwMTQwtDR0Nj4lQBAHtSJp4</recordid><startdate>20220106</startdate><enddate>20220106</enddate><creator>MOOSBURGER, Thomas</creator><creator>STROBL, Matthias</creator><creator>FANDERL, Alexander</creator><creator>ERVEN, Wolfgang</creator><creator>BOERZSOENYI, Christoph</creator><creator>SCHWINN, Bernd</creator><creator>REISINGER, Juergen</creator><creator>WIDMANN, Stefan</creator><scope>EVB</scope></search><sort><creationdate>20220106</creationdate><title>REMAINING SERVICE LIFE PREDICTION FOR SWITCHES</title><author>MOOSBURGER, Thomas ; STROBL, Matthias ; FANDERL, Alexander ; ERVEN, Wolfgang ; BOERZSOENYI, Christoph ; SCHWINN, Bernd ; REISINGER, Juergen ; WIDMANN, Stefan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022004181A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MOOSBURGER, Thomas</creatorcontrib><creatorcontrib>STROBL, Matthias</creatorcontrib><creatorcontrib>FANDERL, Alexander</creatorcontrib><creatorcontrib>ERVEN, Wolfgang</creatorcontrib><creatorcontrib>BOERZSOENYI, Christoph</creatorcontrib><creatorcontrib>SCHWINN, Bernd</creatorcontrib><creatorcontrib>REISINGER, Juergen</creatorcontrib><creatorcontrib>WIDMANN, Stefan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MOOSBURGER, Thomas</au><au>STROBL, Matthias</au><au>FANDERL, Alexander</au><au>ERVEN, Wolfgang</au><au>BOERZSOENYI, Christoph</au><au>SCHWINN, Bernd</au><au>REISINGER, Juergen</au><au>WIDMANN, Stefan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>REMAINING SERVICE LIFE PREDICTION FOR SWITCHES</title><date>2022-01-06</date><risdate>2022</risdate><abstract>Events relevant for the service life are recorded for calculating the remaining service life of a switch. Events relevant for the service life are evaluated with respect to the frequency of their occurrence. The possibility of a future occurrence for the service life of relevant events is taken into account or not taken into account in accordance with the frequency of their occurrence for calculating the remaining service life.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING |
title | REMAINING SERVICE LIFE PREDICTION FOR SWITCHES |
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