Test and Characterization of Ring in Superconducting Domain Through Built-In Self-Test

Ring packet built-in self-test (PBIST) circuitry configured to detect errors in wires connecting a ring of superconducting chips includes circuitry configured to make the PBIST immune to interchip latency and still allow the PBIST to test a stop-to-stop connection. By making a PBIST independent of l...

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Hauptverfasser:	MUFF, ADAM, COMPARAN, MIGUEL, MUMFORD, CLINT WAYNE, ROSELL, OSCAR, SAXENA, KSHITIZ
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING
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