SENSOR PURGE TECHNIQUES AND RELATED SYSTEMS AND METHODS
Techniques for preventing contamination of an electronic component via gas flow are described. According to some aspects, an electronic component module is configured to provide gas flow past and away from an electronic component such that thermal and material exchange is limited between the electro...
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| creator | Keenan, Justin |
| description | Techniques for preventing contamination of an electronic component via gas flow are described. According to some aspects, an electronic component module is configured to provide gas flow past and away from an electronic component such that thermal and material exchange is limited between the electronic component module and a coupled system. In some embodiments, the coupled system may be a portion of an additive fabrication device. As a result, a reduced number of contaminants may adhere to the electronic component, extending its lifespan and reducing maintenance. |
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According to some aspects, an electronic component module is configured to provide gas flow past and away from an electronic component such that thermal and material exchange is limited between the electronic component module and a coupled system. In some embodiments, the coupled system may be a portion of an additive fabrication device. As a result, a reduced number of contaminants may adhere to the electronic component, extending its lifespan and reducing maintenance.</description><language>eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210805&DB=EPODOC&CC=US&NR=2021239535A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210805&DB=EPODOC&CC=US&NR=2021239535A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Keenan, Justin</creatorcontrib><title>SENSOR PURGE TECHNIQUES AND RELATED SYSTEMS AND METHODS</title><description>Techniques for preventing contamination of an electronic component via gas flow are described. According to some aspects, an electronic component module is configured to provide gas flow past and away from an electronic component such that thermal and material exchange is limited between the electronic component module and a coupled system. In some embodiments, the coupled system may be a portion of an additive fabrication device. 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According to some aspects, an electronic component module is configured to provide gas flow past and away from an electronic component such that thermal and material exchange is limited between the electronic component module and a coupled system. In some embodiments, the coupled system may be a portion of an additive fabrication device. As a result, a reduced number of contaminants may adhere to the electronic component, extending its lifespan and reducing maintenance.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | SENSOR PURGE TECHNIQUES AND RELATED SYSTEMS AND METHODS |
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