METHOD FOR ILLUMINATING SAMPLES IN MICROSCOPIC IMAGING METHODS
A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λi, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coord...
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creator | SIEBENMORGEN, Joerg NETZ, Ralf |
description | A method for illuminating samples in microscopic imaging methods, wherein a number m of different wavelengths λi, with m>I and i=I, . . . , m, is selected for the illumination. For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λi such that the predefined structure of the illumination light is generated in the region of the sample. |
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For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). 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For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). 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For each of the wavelengths λi a target phase function Δφi(x, y, λi) is predefined, wherein x and y denote spatial coordinates in a plane perpendicular to an optical axis z and each target phase function Δφi(x, y, λi) is effective only for the corresponding wavelength λi. The target phase functions Δφi are predefined depending on the structure of the sample and/or the beam shape and/or illumination light structure to be impressed on the light used for illumination. A total phase mask is then produced which realises all target phase functions Δφi(x, y, λi). This total phase mask is then illuminated simultaneously or successively with coherent light of wavelengths λi such that the predefined structure of the illumination light is generated in the region of the sample.</abstract><oa>free_for_read</oa></addata></record> |
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title | METHOD FOR ILLUMINATING SAMPLES IN MICROSCOPIC IMAGING METHODS |
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