REPAIR ANALYSIS CIRCUIT AND MEMORY INCLUDING THE SAME

A memory may include a first repair analysis circuit suitable for storing an input fail address when the input fail address is different from a fail address which is already stored in the first repair analysis circuit, and outputting the input fail address as a first transfer fail address when a sto...

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Bibliographische Detailangaben

1. Verfasser:	CHO, Hosung
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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