CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE

The present invention relates to a contact and a socket device for testing a semiconductor device. The contact of the present invention is a spring contact which is integrally formed by blanking and bending a metal plate member and includes an elastic portion made of various strips of certain patter...

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Bibliographische Detailangaben
Hauptverfasser:	Hwang, Dong Weon, Hwang, Jae Baek, Hwang, Jae Suk
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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