APPARATUS AND METHOD TO ACHIEVE FAST-FAULT DETECTION ON POWER SEMICONDUCTOR DEVICES

An apparatus and methods to operate the same to provide fast fault-detection on power semiconductor devices such as power transistors are disclosed. In some embodiment, a desaturation based fault-detection circuit for a power transistor is provided. The fault-detection circuit has an adaptable blank...

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Bibliographische Detailangaben
Hauptverfasser:	Tanghe, Steven, Zirger, Art, Collins, Michael John, Richardson, Kenneth G, Gunasekaran, Deepak, Jadus, Brian
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING
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Beschreibung
Zusammenfassung:	An apparatus and methods to operate the same to provide fast fault-detection on power semiconductor devices such as power transistors are disclosed. In some embodiment, a desaturation based fault-detection circuit for a power transistor is provided. The fault-detection circuit has an adaptable blanking time and a disconnect switch in the blanking mechanism that allow for quick enabling of fault-detection mechanisms to achieve fast fault detection times on power semiconductor devices.