REDUNDANT HALL ANGLE MEASUREMENT IN A CHIP
A magnetic angle sensor includes a semiconductor chip that includes: a pair of vertical Hall sensor elements configured to generate vertical Hall sensor signals in response to a magnetic field impinging thereon; a first pair of lateral Hall sensor elements configured to generate first lateral Hall s...
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| creator | HEINZ, Richard LEISENHEIMER, Stephan |
| description | A magnetic angle sensor includes a semiconductor chip that includes: a pair of vertical Hall sensor elements configured to generate vertical Hall sensor signals in response to a magnetic field impinging thereon; a first pair of lateral Hall sensor elements configured to generate first lateral Hall sensor signals in response to the magnetic field impinging thereon; a second pair of lateral Hall sensor elements configured to generate second lateral Hall sensor signals in response to the magnetic field impinging thereon; and a sensor circuit configured to: determine a first angle value corresponding to an orientation of the magnetic field based on the vertical Hall sensor signals, determine a second angle value corresponding to the orientation of the magnetic field based on the first and the second lateral Hall sensor signals, and determine whether the first and the second angle values are within an acceptable tolerance range of each other. |
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a first pair of lateral Hall sensor elements configured to generate first lateral Hall sensor signals in response to the magnetic field impinging thereon; a second pair of lateral Hall sensor elements configured to generate second lateral Hall sensor signals in response to the magnetic field impinging thereon; and a sensor circuit configured to: determine a first angle value corresponding to an orientation of the magnetic field based on the vertical Hall sensor signals, determine a second angle value corresponding to the orientation of the magnetic field based on the first and the second lateral Hall sensor signals, and determine whether the first and the second angle values are within an acceptable tolerance range of each other.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; 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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | REDUNDANT HALL ANGLE MEASUREMENT IN A CHIP |
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