IMAGING DEVICE AND CALIBRATION METHOD
To obtain an imaging device that can improve temperature detection accuracy. An imaging device of the present disclosure includes a processing unit formed on a first semiconductor substrate and capable of performing predetermined image processing on the basis of image data obtained by an imaging uni...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Kawazu, Naoki Oka, Takumi Suzuki, Atsushi Sasaki, Keita Baba, Masahiro Fujimori, Nobuhiko Yamamoto, Satoshi Motohashi, Yuichi Haque, Mohammad Munir Satou, Makoto |
| description | To obtain an imaging device that can improve temperature detection accuracy. An imaging device of the present disclosure includes a processing unit formed on a first semiconductor substrate and capable of performing predetermined image processing on the basis of image data obtained by an imaging unit, a temperature sensor formed on the first semiconductor substrate and capable of generating a detection signal according to a temperature, and a first pad electrode formed on the first semiconductor substrate and electrically insulated from a circuit formed on the first semiconductor substrate. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2021041305A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2021041305A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2021041305A13</originalsourceid><addsrcrecordid>eNrjZFD19HV09_RzV3BxDfN0dlVw9HNRcHb08XQKcgzx9PdT8HUN8fB34WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGhgYmhsYGpo6GxsSpAgAGwCPM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IMAGING DEVICE AND CALIBRATION METHOD</title><source>esp@cenet</source><creator>Kawazu, Naoki ; Oka, Takumi ; Suzuki, Atsushi ; Sasaki, Keita ; Baba, Masahiro ; Fujimori, Nobuhiko ; Yamamoto, Satoshi ; Motohashi, Yuichi ; Haque, Mohammad Munir ; Satou, Makoto</creator><creatorcontrib>Kawazu, Naoki ; Oka, Takumi ; Suzuki, Atsushi ; Sasaki, Keita ; Baba, Masahiro ; Fujimori, Nobuhiko ; Yamamoto, Satoshi ; Motohashi, Yuichi ; Haque, Mohammad Munir ; Satou, Makoto</creatorcontrib><description>To obtain an imaging device that can improve temperature detection accuracy. An imaging device of the present disclosure includes a processing unit formed on a first semiconductor substrate and capable of performing predetermined image processing on the basis of image data obtained by an imaging unit, a temperature sensor formed on the first semiconductor substrate and capable of generating a detection signal according to a temperature, and a first pad electrode formed on the first semiconductor substrate and electrically insulated from a circuit formed on the first semiconductor substrate.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; HANDLING RECORD CARRIERS ; MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210211&DB=EPODOC&CC=US&NR=2021041305A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210211&DB=EPODOC&CC=US&NR=2021041305A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kawazu, Naoki</creatorcontrib><creatorcontrib>Oka, Takumi</creatorcontrib><creatorcontrib>Suzuki, Atsushi</creatorcontrib><creatorcontrib>Sasaki, Keita</creatorcontrib><creatorcontrib>Baba, Masahiro</creatorcontrib><creatorcontrib>Fujimori, Nobuhiko</creatorcontrib><creatorcontrib>Yamamoto, Satoshi</creatorcontrib><creatorcontrib>Motohashi, Yuichi</creatorcontrib><creatorcontrib>Haque, Mohammad Munir</creatorcontrib><creatorcontrib>Satou, Makoto</creatorcontrib><title>IMAGING DEVICE AND CALIBRATION METHOD</title><description>To obtain an imaging device that can improve temperature detection accuracy. An imaging device of the present disclosure includes a processing unit formed on a first semiconductor substrate and capable of performing predetermined image processing on the basis of image data obtained by an imaging unit, a temperature sensor formed on the first semiconductor substrate and capable of generating a detection signal according to a temperature, and a first pad electrode formed on the first semiconductor substrate and electrically insulated from a circuit formed on the first semiconductor substrate.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>HANDLING RECORD CARRIERS</subject><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD19HV09_RzV3BxDfN0dlVw9HNRcHb08XQKcgzx9PdT8HUN8fB34WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGhgYmhsYGpo6GxsSpAgAGwCPM</recordid><startdate>20210211</startdate><enddate>20210211</enddate><creator>Kawazu, Naoki</creator><creator>Oka, Takumi</creator><creator>Suzuki, Atsushi</creator><creator>Sasaki, Keita</creator><creator>Baba, Masahiro</creator><creator>Fujimori, Nobuhiko</creator><creator>Yamamoto, Satoshi</creator><creator>Motohashi, Yuichi</creator><creator>Haque, Mohammad Munir</creator><creator>Satou, Makoto</creator><scope>EVB</scope></search><sort><creationdate>20210211</creationdate><title>IMAGING DEVICE AND CALIBRATION METHOD</title><author>Kawazu, Naoki ; Oka, Takumi ; Suzuki, Atsushi ; Sasaki, Keita ; Baba, Masahiro ; Fujimori, Nobuhiko ; Yamamoto, Satoshi ; Motohashi, Yuichi ; Haque, Mohammad Munir ; Satou, Makoto</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2021041305A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>HANDLING RECORD CARRIERS</topic><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Kawazu, Naoki</creatorcontrib><creatorcontrib>Oka, Takumi</creatorcontrib><creatorcontrib>Suzuki, Atsushi</creatorcontrib><creatorcontrib>Sasaki, Keita</creatorcontrib><creatorcontrib>Baba, Masahiro</creatorcontrib><creatorcontrib>Fujimori, Nobuhiko</creatorcontrib><creatorcontrib>Yamamoto, Satoshi</creatorcontrib><creatorcontrib>Motohashi, Yuichi</creatorcontrib><creatorcontrib>Haque, Mohammad Munir</creatorcontrib><creatorcontrib>Satou, Makoto</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kawazu, Naoki</au><au>Oka, Takumi</au><au>Suzuki, Atsushi</au><au>Sasaki, Keita</au><au>Baba, Masahiro</au><au>Fujimori, Nobuhiko</au><au>Yamamoto, Satoshi</au><au>Motohashi, Yuichi</au><au>Haque, Mohammad Munir</au><au>Satou, Makoto</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGING DEVICE AND CALIBRATION METHOD</title><date>2021-02-11</date><risdate>2021</risdate><abstract>To obtain an imaging device that can improve temperature detection accuracy. An imaging device of the present disclosure includes a processing unit formed on a first semiconductor substrate and capable of performing predetermined image processing on the basis of image data obtained by an imaging unit, a temperature sensor formed on the first semiconductor substrate and capable of generating a detection signal according to a temperature, and a first pad electrode formed on the first semiconductor substrate and electrically insulated from a circuit formed on the first semiconductor substrate.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2021041305A1 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY HANDLING RECORD CARRIERS MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | IMAGING DEVICE AND CALIBRATION METHOD |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T23%3A21%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kawazu,%20Naoki&rft.date=2021-02-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2021041305A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |