METHOD AND DEVICE FOR MAPPING COMPONENTS FOR DETECTING ELONGATION DIRECTION

METHOD AND DEVICE FOR MAPPING COMPONENTS FOR DETECTING ELONGATION DIRECTION

The invention concerns a method for the non-destructive mapping of a component, in order to determine an elongation direction of the elongate microstructure of the component at at least one point of interest, characterised in that it comprises at least two successive intensity measurement steps comp...

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Hauptverfasser: PRADA, Claire, BAELDE, Aurelien, JENSON, Frederic
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator PRADA, Claire
BAELDE, Aurelien
JENSON, Frederic
description The invention concerns a method for the non-destructive mapping of a component, in order to determine an elongation direction of the elongate microstructure of the component at at least one point of interest, characterised in that it comprises at least two successive intensity measurement steps comprising the following steps: a sub-step of rotating a linear transducer into a plurality of angular positions, said linear transducer comprising a plurality of transducer elements, a sub-step of emitting a plurality of elementary ultrasonic beams at each angular position, a sub-step of measuring a plurality of backscattered signals resulting from the backscattering of the elementary ultrasonic beams by said elongate microstructure, the intensity measurement steps making it possible to obtain two series of intensities measured according to two axes of rotation, and in that the method comprises a step of combining the measured series of intensities so as to determine the elongation direction of the microstructure at said at least one point of interest.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD AND DEVICE FOR MAPPING COMPONENTS FOR DETECTING ELONGATION DIRECTION
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