INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTRUCTION

A test socket for a device under test (DUT) is disclosed in several embodiments. One embodiment shows a test socket base (16) with apertures (30) for insertion of test pin insert blocks (28). The blocks are inserted top-in or bottom-in and are provided with registration bosses 80 and teeth 92 or oth...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Erdman, Joel, Sherry, Jeffrey
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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