MATERIAL SAMPLE, DISPLAY METHOD, AND ESTIMATION METHOD

MATERIAL SAMPLE, DISPLAY METHOD, AND ESTIMATION METHOD

Provided is a technique capable of adequately presenting the product specifications of a material sample even when the concentration distribution of the material is asymmetrical. A material sample according to the present disclosure stores a material having variation according to a probability distr...

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Hauptverfasser: UNNO, Hirotaka, SEO, Manabu, HATADA, Shigeo, JI, Yunong
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
PHYSICS
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creator UNNO, Hirotaka
SEO, Manabu
HATADA, Shigeo
JI, Yunong
description Provided is a technique capable of adequately presenting the product specifications of a material sample even when the concentration distribution of the material is asymmetrical. A material sample according to the present disclosure stores a material having variation according to a probability distribution. As the product specifications of the material sample, the representative value of the probability distribution as well as an interval in which the amount of the material is greater than or equal to a target probability on the probability distribution is displayed.
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
PHYSICS
title MATERIAL SAMPLE, DISPLAY METHOD, AND ESTIMATION METHOD
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