METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS

Methods for matching features in patterns for electronic designs include inputting a set of pattern data for semiconductor or flat panel displays, where the set of pattern data comprises a plurality of features. Each feature in the plurality of features is classified, where the classifying is based...

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Hauptverfasser:	Niewczas, Mariusz, Shendre, Abhishek
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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creator	Niewczas, Mariusz Shendre, Abhishek
description	Methods for matching features in patterns for electronic designs include inputting a set of pattern data for semiconductor or flat panel displays, where the set of pattern data comprises a plurality of features. Each feature in the plurality of features is classified, where the classifying is based on a geometrical context defined by shapes in a region. The classifying uses machine learning techniques.
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title	METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS
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