TENSOR FIELD MAPPING WITH MAGNETOSTATIC CONSTRAINT

A system may measure, using a measurement device, a response associated with a sample to an excitation. Then, the system may compute, using the measured response and the excitation as inputs to one of an inverse model and a predetermined predictive model, model parameters on a voxel-by-voxel basis i...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Polymeridis, Athanasios, Lefkimmiatis, Stamatis, Tayli, Doruk
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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