PROBE, MEASURING SYSTEM AND METHOD FOR APPLYING A PROBE

The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The ca...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Boss, Hermann, Steffens, Johannes
Format: Patent
Sprache:eng
Schlagworte:
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