Method and System for Fault Verification of Electronic Device

A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure...

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Bibliographische Detailangaben
1. Verfasser:	Liu, Nianfeng
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.