X-RAY IMAGING REFERENCE SCAN

The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray sou...

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Hauptverfasser: KOEHLER, THOMAS, DE MARCO, FABIO, GROMANN, LUKAS BENEDICT, NÖEL, PETER BENJAMIN THEODOR, WILLER, KONSTANTIN, YAROSHENKO, ANDRIY
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creator KOEHLER, THOMAS
DE MARCO, FABIO
GROMANN, LUKAS BENEDICT
NÖEL, PETER BENJAMIN THEODOR
WILLER, KONSTANTIN
YAROSHENKO, ANDRIY
description The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10′″) with less scanning motions.
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subjects DIAGNOSIS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEDICAL OR VETERINARY SCIENCE
PHYSICS
SURGERY
TESTING
title X-RAY IMAGING REFERENCE SCAN
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