METHOD AND APPARATUS FOR A PRECISION POSITION SENSOR
A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors,...
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| creator | Roberts, David Bryan Atkins, Brady Garrett Covington, Charles Eric |
| description | A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device. |
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obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.</description><language>eng</language><subject>AEROPLANES ; AIRCRAFT ; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; AVIATION ; COSMONAUTICS ; HELICOPTERS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; 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obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.</description><subject>AEROPLANES</subject><subject>AIRCRAFT</subject><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>AVIATION</subject><subject>COSMONAUTICS</subject><subject>HELICOPTERS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDxdQ3x8HdRcPQD4oAAxyDHkNBgBTf_IAVHhYAgV2fPYE9_P4UA_2DPEBAj2NUv2D-Ih4E1LTGnOJUXSnMzKLu5hjh76KYW5MenFhckJqfmpZbEhwYbGQChsZG5haGjoTFxqgBf7yhN</recordid><startdate>20200723</startdate><enddate>20200723</enddate><creator>Roberts, David Bryan</creator><creator>Atkins, Brady Garrett</creator><creator>Covington, Charles Eric</creator><scope>EVB</scope></search><sort><creationdate>20200723</creationdate><title>METHOD AND APPARATUS FOR A PRECISION POSITION SENSOR</title><author>Roberts, David Bryan ; Atkins, Brady Garrett ; Covington, Charles Eric</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2020232781A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>AEROPLANES</topic><topic>AIRCRAFT</topic><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>AVIATION</topic><topic>COSMONAUTICS</topic><topic>HELICOPTERS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Roberts, David Bryan</creatorcontrib><creatorcontrib>Atkins, Brady Garrett</creatorcontrib><creatorcontrib>Covington, Charles Eric</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Roberts, David Bryan</au><au>Atkins, Brady Garrett</au><au>Covington, Charles Eric</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND APPARATUS FOR A PRECISION POSITION SENSOR</title><date>2020-07-23</date><risdate>2020</risdate><abstract>A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | AEROPLANES AIRCRAFT ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS AVIATION COSMONAUTICS HELICOPTERS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PERFORMING OPERATIONS PHYSICS TARIFF METERING APPARATUS TESTING TRANSPORTING |
| title | METHOD AND APPARATUS FOR A PRECISION POSITION SENSOR |
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