TIME-SERIES FAULT DETECTION, FAULT CLASSIFICATION, AND TRANSITION ANALYSIS USING A K-NEAREST-NEIGHBOR AND LOGISTIC REGRESSION APPROACH

A method includes receiving historical time-series data and generating training data comprising a plurality of randomized data points associated with the historical time-series data. The historical time-series data was generated by one or more sensors during one or more processes. The method further...

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description A method includes receiving historical time-series data and generating training data comprising a plurality of randomized data points associated with the historical time-series data. The historical time-series data was generated by one or more sensors during one or more processes. The method further includes training a logistic regression classifier based on the training data to generate a trained logistic regression classifier. The trained logistic regression classifier is associated with a logistic regression that indicates a location of a transition pattern from a first data point to a second data point. The transition pattern reflects about a reflection point located on the transition pattern. The trained logistic regression classifier is capable of indicating a probability that new time-series data generated during a new execution of the one or more processes matches the historical time-series data.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2020210873A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2020210873A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2020210873A13</originalsourceid><addsrcrecordid>eNqNizEOwjAUQ7swIOAOkVip1NIB1k_6m34REpSfDkxVhcKEoFI5A-cmlB4AebD8bM-Tt6cTpoyOkEUFjfaiRI_SkzWbCUgNzFSRhB8FUwrvwDB9c4ygL0wsGiajBIhjahAcso9Oqj5YN160VcSepHCoYsvj93x2FmS9TGa37j6E1eSLZF2hl3Ua-mcbhr67hkd4tQ1vs6g82-8KyIv_Vh_U_D7D</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TIME-SERIES FAULT DETECTION, FAULT CLASSIFICATION, AND TRANSITION ANALYSIS USING A K-NEAREST-NEIGHBOR AND LOGISTIC REGRESSION APPROACH</title><source>esp@cenet</source><creator>Cantwell, Dermot</creator><creatorcontrib>Cantwell, Dermot</creatorcontrib><description>A method includes receiving historical time-series data and generating training data comprising a plurality of randomized data points associated with the historical time-series data. The historical time-series data was generated by one or more sensors during one or more processes. The method further includes training a logistic regression classifier based on the training data to generate a trained logistic regression classifier. The trained logistic regression classifier is associated with a logistic regression that indicates a location of a transition pattern from a first data point to a second data point. The transition pattern reflects about a reflection point located on the transition pattern. The trained logistic regression classifier is capable of indicating a probability that new time-series data generated during a new execution of the one or more processes matches the historical time-series data.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200702&amp;DB=EPODOC&amp;CC=US&amp;NR=2020210873A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200702&amp;DB=EPODOC&amp;CC=US&amp;NR=2020210873A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Cantwell, Dermot</creatorcontrib><title>TIME-SERIES FAULT DETECTION, FAULT CLASSIFICATION, AND TRANSITION ANALYSIS USING A K-NEAREST-NEIGHBOR AND LOGISTIC REGRESSION APPROACH</title><description>A method includes receiving historical time-series data and generating training data comprising a plurality of randomized data points associated with the historical time-series data. The historical time-series data was generated by one or more sensors during one or more processes. The method further includes training a logistic regression classifier based on the training data to generate a trained logistic regression classifier. The trained logistic regression classifier is associated with a logistic regression that indicates a location of a transition pattern from a first data point to a second data point. The transition pattern reflects about a reflection point located on the transition pattern. The trained logistic regression classifier is capable of indicating a probability that new time-series data generated during a new execution of the one or more processes matches the historical time-series data.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizEOwjAUQ7swIOAOkVip1NIB1k_6m34REpSfDkxVhcKEoFI5A-cmlB4AebD8bM-Tt6cTpoyOkEUFjfaiRI_SkzWbCUgNzFSRhB8FUwrvwDB9c4ygL0wsGiajBIhjahAcso9Oqj5YN160VcSepHCoYsvj93x2FmS9TGa37j6E1eSLZF2hl3Ua-mcbhr67hkd4tQ1vs6g82-8KyIv_Vh_U_D7D</recordid><startdate>20200702</startdate><enddate>20200702</enddate><creator>Cantwell, Dermot</creator><scope>EVB</scope></search><sort><creationdate>20200702</creationdate><title>TIME-SERIES FAULT DETECTION, FAULT CLASSIFICATION, AND TRANSITION ANALYSIS USING A K-NEAREST-NEIGHBOR AND LOGISTIC REGRESSION APPROACH</title><author>Cantwell, Dermot</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2020210873A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Cantwell, Dermot</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cantwell, Dermot</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TIME-SERIES FAULT DETECTION, FAULT CLASSIFICATION, AND TRANSITION ANALYSIS USING A K-NEAREST-NEIGHBOR AND LOGISTIC REGRESSION APPROACH</title><date>2020-07-02</date><risdate>2020</risdate><abstract>A method includes receiving historical time-series data and generating training data comprising a plurality of randomized data points associated with the historical time-series data. The historical time-series data was generated by one or more sensors during one or more processes. The method further includes training a logistic regression classifier based on the training data to generate a trained logistic regression classifier. The trained logistic regression classifier is associated with a logistic regression that indicates a location of a transition pattern from a first data point to a second data point. The transition pattern reflects about a reflection point located on the transition pattern. The trained logistic regression classifier is capable of indicating a probability that new time-series data generated during a new execution of the one or more processes matches the historical time-series data.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title TIME-SERIES FAULT DETECTION, FAULT CLASSIFICATION, AND TRANSITION ANALYSIS USING A K-NEAREST-NEIGHBOR AND LOGISTIC REGRESSION APPROACH
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T21%3A49%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Cantwell,%20Dermot&rft.date=2020-07-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2020210873A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true