OPTICAL ANALYSIS DEVICE, AND MACHINE LEARNING DEVICE USED FOR OPTICAL ANALYSIS DEVICE, AND METHOD FOR THE SAME

The present invention refers to an optical analysis device for performing output correction of a detector used for an optical analysis device. The optical analysis device includes a light source which irradiates light, a measurement cell into which the light irradiated from the light source is input...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ANDO, Yoshitake
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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