MIDDLE OF THE LINE SELF-ALIGNED DIRECT PATTERN CONTACTS

The present disclosure relates to semiconductor structures and, more particularly, to middle of the line self-aligned direct pattern contacts and methods of manufacture. The structures described herein include: at least one gate structure with a metallization and source/drain regions; a source/drain...

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Hauptverfasser: XIE, Ruilong, NORTHROP, Gregory A, STEPHENS, Jason E, LIEBMANN, Lars W, CHANEMOUGAME, Daniel
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creator XIE, Ruilong
NORTHROP, Gregory A
STEPHENS, Jason E
LIEBMANN, Lars W
CHANEMOUGAME, Daniel
description The present disclosure relates to semiconductor structures and, more particularly, to middle of the line self-aligned direct pattern contacts and methods of manufacture. The structures described herein include: at least one gate structure with a metallization and source/drain regions; a source/drain contact in electrical connection with the source/drain regions, respectively; and a contact structure with a re-entrant profile in electrical connection with the source/drain contact and the metallization of the at least one gate structure, respectively.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2020083102A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2020083102A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2020083102A13</originalsourceid><addsrcrecordid>eNrjZDD39XRx8XFV8HdTCPFwVfDx9HNVCHb1cdN19PF093N1UXDxDHJ1DlEIcAwJcQ3yU3D29wtxdA4J5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGBgYWxoYGRo6GxsSpAgCk3yim</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MIDDLE OF THE LINE SELF-ALIGNED DIRECT PATTERN CONTACTS</title><source>esp@cenet</source><creator>XIE, Ruilong ; NORTHROP, Gregory A ; STEPHENS, Jason E ; LIEBMANN, Lars W ; CHANEMOUGAME, Daniel</creator><creatorcontrib>XIE, Ruilong ; NORTHROP, Gregory A ; STEPHENS, Jason E ; LIEBMANN, Lars W ; CHANEMOUGAME, Daniel</creatorcontrib><description>The present disclosure relates to semiconductor structures and, more particularly, to middle of the line self-aligned direct pattern contacts and methods of manufacture. The structures described herein include: at least one gate structure with a metallization and source/drain regions; a source/drain contact in electrical connection with the source/drain regions, respectively; and a contact structure with a re-entrant profile in electrical connection with the source/drain contact and the metallization of the at least one gate structure, respectively.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200312&amp;DB=EPODOC&amp;CC=US&amp;NR=2020083102A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200312&amp;DB=EPODOC&amp;CC=US&amp;NR=2020083102A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIE, Ruilong</creatorcontrib><creatorcontrib>NORTHROP, Gregory A</creatorcontrib><creatorcontrib>STEPHENS, Jason E</creatorcontrib><creatorcontrib>LIEBMANN, Lars W</creatorcontrib><creatorcontrib>CHANEMOUGAME, Daniel</creatorcontrib><title>MIDDLE OF THE LINE SELF-ALIGNED DIRECT PATTERN CONTACTS</title><description>The present disclosure relates to semiconductor structures and, more particularly, to middle of the line self-aligned direct pattern contacts and methods of manufacture. The structures described herein include: at least one gate structure with a metallization and source/drain regions; a source/drain contact in electrical connection with the source/drain regions, respectively; and a contact structure with a re-entrant profile in electrical connection with the source/drain contact and the metallization of the at least one gate structure, respectively.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD39XRx8XFV8HdTCPFwVfDx9HNVCHb1cdN19PF093N1UXDxDHJ1DlEIcAwJcQ3yU3D29wtxdA4J5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGBgYWxoYGRo6GxsSpAgCk3yim</recordid><startdate>20200312</startdate><enddate>20200312</enddate><creator>XIE, Ruilong</creator><creator>NORTHROP, Gregory A</creator><creator>STEPHENS, Jason E</creator><creator>LIEBMANN, Lars W</creator><creator>CHANEMOUGAME, Daniel</creator><scope>EVB</scope></search><sort><creationdate>20200312</creationdate><title>MIDDLE OF THE LINE SELF-ALIGNED DIRECT PATTERN CONTACTS</title><author>XIE, Ruilong ; NORTHROP, Gregory A ; STEPHENS, Jason E ; LIEBMANN, Lars W ; CHANEMOUGAME, Daniel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2020083102A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2020</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>XIE, Ruilong</creatorcontrib><creatorcontrib>NORTHROP, Gregory A</creatorcontrib><creatorcontrib>STEPHENS, Jason E</creatorcontrib><creatorcontrib>LIEBMANN, Lars W</creatorcontrib><creatorcontrib>CHANEMOUGAME, Daniel</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIE, Ruilong</au><au>NORTHROP, Gregory A</au><au>STEPHENS, Jason E</au><au>LIEBMANN, Lars W</au><au>CHANEMOUGAME, Daniel</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MIDDLE OF THE LINE SELF-ALIGNED DIRECT PATTERN CONTACTS</title><date>2020-03-12</date><risdate>2020</risdate><abstract>The present disclosure relates to semiconductor structures and, more particularly, to middle of the line self-aligned direct pattern contacts and methods of manufacture. The structures described herein include: at least one gate structure with a metallization and source/drain regions; a source/drain contact in electrical connection with the source/drain regions, respectively; and a contact structure with a re-entrant profile in electrical connection with the source/drain contact and the metallization of the at least one gate structure, respectively.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title MIDDLE OF THE LINE SELF-ALIGNED DIRECT PATTERN CONTACTS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T16%3A01%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=XIE,%20Ruilong&rft.date=2020-03-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2020083102A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true