ERROR DETECTION CODE GENERATION CIRCUITS OF SEMICONDUCTOR DEVICES, MEMORY CONTROLLERS INCLUDING THE SAME AND SEMICONDUCTOR MEMORY DEVICES INCLUDING THE SAME

An error detection code generation circuit of a semiconductor device includes a first cyclic redundancy check (CRC) engine, a second CRC engine and an output selection engine. The first CRC engine generates first error detection code bits using a first generation matrix, based on a plurality of firs...

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Bibliographische Detailangaben

Hauptverfasser:	CHA, Sang-Uhn, DOO, Su-Yeon, RYU, Ye-Sin, KIM, Young-Sik
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY
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