DATA STORAGE DEVICE CALIBRATING DATA DENSITY BASED ON AMPLITUDE-INVERTED OR TIME-INVERTED READ SIGNAL

A data storage device is disclosed comprising a head actuated over a disk. A test pattern is read from a first part of the disk to generate a first read signal that is sampled to generate a first sequence of signal samples. The test pattern is read from a second part of the disk to generate a second...

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Bibliographische Detailangaben
Hauptverfasser: Eaton, Robert E, Nichols, Mark A
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A data storage device is disclosed comprising a head actuated over a disk. A test pattern is read from a first part of the disk to generate a first read signal that is sampled to generate a first sequence of signal samples. The test pattern is read from a second part of the disk to generate a second read signal that is sampled to generate a second sequence of signal samples. A third sequence of signal samples is generated by at least one of amplitude-inverting the second sequence of signal samples, time-inverting the second sequence of signal samples, and amplitude-inverting and time-inverting the second sequence of signal samples. A quality metric is generated based on the first sequence of signal samples and the third sequence of signal samples, and a data density of the disk is configured based on the quality metric.