MAGNETIC RESONANCE IMAGING APPARATUS, MULTI-SLICE IMAGING METHOD, AND SHIMMING VALUE CALCULATION APPARATUS

MAGNETIC RESONANCE IMAGING APPARATUS, MULTI-SLICE IMAGING METHOD, AND SHIMMING VALUE CALCULATION APPARATUS

According to one embodiment, a magnetic resonance imaging apparatus includes processing circuitry calculating 0-order shimming value for correcting 0-order components of inhomogeneity of a static magnetic field of a collection region in multi-slice collection for each of slices in the collection reg...

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Hauptverfasser: WATANABE, Takashi, NITTA, Shuhei
Format: Patent
Sprache:eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator WATANABE, Takashi
NITTA, Shuhei
description According to one embodiment, a magnetic resonance imaging apparatus includes processing circuitry calculating 0-order shimming value for correcting 0-order components of inhomogeneity of a static magnetic field of a collection region in multi-slice collection for each of slices in the collection region, first-order shimming values for correcting first-order components of the inhomogeneity for each of the slices in the collection region, and multiple-order shimming values for correcting second or higher-order components of the inhomogeneity over the entire of the collection region, by using a distribution of the static magnetic field in the collection region, and imaging control circuitry performing the multi-slice collection to the collection region by using the 0-order, first-order, and multiple-order shimming values.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title MAGNETIC RESONANCE IMAGING APPARATUS, MULTI-SLICE IMAGING METHOD, AND SHIMMING VALUE CALCULATION APPARATUS
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