Integrity Monitor Peripheral For Microcontroller And Processor Input/Output Pins

A semiconductor die includes a feedback path coupled to the output pin, and an integrity monitor circuit (IMC). The output pin is communicatively coupled to the logic. The IMC is configured to receive a data value. The IMC is further configured to receive measured data value from the output pin rout...

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Hauptverfasser:	Balu, Manivannan, Bowling, Stephen, Wojewoda, Igor
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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creator	Balu, Manivannan Bowling, Stephen Wojewoda, Igor
description	A semiconductor die includes a feedback path coupled to the output pin, and an integrity monitor circuit (IMC). The output pin is communicatively coupled to the logic. The IMC is configured to receive a data value. The IMC is further configured to receive measured data value from the output pin routed through the feedback path, compare the data value and the measured data value, and, based on the comparison, determine whether an error has occurred.
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The output pin is communicatively coupled to the logic. The IMC is configured to receive a data value. The IMC is further configured to receive measured data value from the output pin routed through the feedback path, compare the data value and the measured data value, and, based on the comparison, determine whether an error has occurred.</abstract><oa>free_for_read</oa></addata></record>
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title	Integrity Monitor Peripheral For Microcontroller And Processor Input/Output Pins
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