SYSTEMS AND METHODS FOR MEASURING AND CHARACTERIZING INTERIOR SURFACES OF LUMINAL STRUCTURES
A digital topographic model of the luminal surface is generated by projecting an optical pattern on the luminal surface from the first location within the lumen. At least a portion of the projected pattern is detected from a second location within the lumen which is based apart from the first locati...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!