PLANT EVALUATION DEVICE AND PLANT EVALUATION METHOD
A plant evaluation apparatus includes: a first computation unit configured to compute a first estimated value of a plant state quantity by using a steady-state model; a first determination unit configured to compute a second estimated value of the plant state quantity by assigning an equipment param...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Nakagawa, Yosuke Ishibashi, Naohiko |
| description | A plant evaluation apparatus includes: a first computation unit configured to compute a first estimated value of a plant state quantity by using a steady-state model; a first determination unit configured to compute a second estimated value of the plant state quantity by assigning an equipment parameter in a normal state to an equipment parameter of a non-steady-state model; a second computation unit configured to compute a third estimated value of the plant state quantity by using the steady-state model in a case where the first determination unit determines that an error between the second estimated value and an actually measured value is equal to or more than a threshold value; and a second determination unit configured to determine whether or not a difference between the equipment parameter in the normal state and the equipment parameter in an abnormal state is equal to or more than a predetermined value. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019154487A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019154487A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019154487A13</originalsourceid><addsrcrecordid>eNrjZDAO8HH0C1FwDXP0CXUM8fT3U3BxDfN0dlVw9HNRwJDzdQ3x8HfhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoaWhqYmJhbmjobGxKkCADm0KBI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PLANT EVALUATION DEVICE AND PLANT EVALUATION METHOD</title><source>esp@cenet</source><creator>Nakagawa, Yosuke ; Ishibashi, Naohiko</creator><creatorcontrib>Nakagawa, Yosuke ; Ishibashi, Naohiko</creatorcontrib><description>A plant evaluation apparatus includes: a first computation unit configured to compute a first estimated value of a plant state quantity by using a steady-state model; a first determination unit configured to compute a second estimated value of the plant state quantity by assigning an equipment parameter in a normal state to an equipment parameter of a non-steady-state model; a second computation unit configured to compute a third estimated value of the plant state quantity by using the steady-state model in a case where the first determination unit determines that an error between the second estimated value and an actually measured value is equal to or more than a threshold value; and a second determination unit configured to determine whether or not a difference between the equipment parameter in the normal state and the equipment parameter in an abnormal state is equal to or more than a predetermined value.</description><language>eng</language><subject>MEASURING ; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL ; METERING BY VOLUME ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190523&DB=EPODOC&CC=US&NR=2019154487A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190523&DB=EPODOC&CC=US&NR=2019154487A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Nakagawa, Yosuke</creatorcontrib><creatorcontrib>Ishibashi, Naohiko</creatorcontrib><title>PLANT EVALUATION DEVICE AND PLANT EVALUATION METHOD</title><description>A plant evaluation apparatus includes: a first computation unit configured to compute a first estimated value of a plant state quantity by using a steady-state model; a first determination unit configured to compute a second estimated value of the plant state quantity by assigning an equipment parameter in a normal state to an equipment parameter of a non-steady-state model; a second computation unit configured to compute a third estimated value of the plant state quantity by using the steady-state model in a case where the first determination unit determines that an error between the second estimated value and an actually measured value is equal to or more than a threshold value; and a second determination unit configured to determine whether or not a difference between the equipment parameter in the normal state and the equipment parameter in an abnormal state is equal to or more than a predetermined value.</description><subject>MEASURING</subject><subject>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</subject><subject>METERING BY VOLUME</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAO8HH0C1FwDXP0CXUM8fT3U3BxDfN0dlVw9HNRwJDzdQ3x8HfhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoaWhqYmJhbmjobGxKkCADm0KBI</recordid><startdate>20190523</startdate><enddate>20190523</enddate><creator>Nakagawa, Yosuke</creator><creator>Ishibashi, Naohiko</creator><scope>EVB</scope></search><sort><creationdate>20190523</creationdate><title>PLANT EVALUATION DEVICE AND PLANT EVALUATION METHOD</title><author>Nakagawa, Yosuke ; Ishibashi, Naohiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019154487A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</topic><topic>METERING BY VOLUME</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Nakagawa, Yosuke</creatorcontrib><creatorcontrib>Ishibashi, Naohiko</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Nakagawa, Yosuke</au><au>Ishibashi, Naohiko</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PLANT EVALUATION DEVICE AND PLANT EVALUATION METHOD</title><date>2019-05-23</date><risdate>2019</risdate><abstract>A plant evaluation apparatus includes: a first computation unit configured to compute a first estimated value of a plant state quantity by using a steady-state model; a first determination unit configured to compute a second estimated value of the plant state quantity by assigning an equipment parameter in a normal state to an equipment parameter of a non-steady-state model; a second computation unit configured to compute a third estimated value of the plant state quantity by using the steady-state model in a case where the first determination unit determines that an error between the second estimated value and an actually measured value is equal to or more than a threshold value; and a second determination unit configured to determine whether or not a difference between the equipment parameter in the normal state and the equipment parameter in an abnormal state is equal to or more than a predetermined value.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2019154487A1 |
| source | esp@cenet |
| subjects | MEASURING MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TESTING |
| title | PLANT EVALUATION DEVICE AND PLANT EVALUATION METHOD |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T11%3A07%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Nakagawa,%20Yosuke&rft.date=2019-05-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019154487A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |