On-Die Aging Measurements for Dynamic Timing Modeling

A method includes mapping an AMC into the core fabric of an FPGA and operating the AMC for a select time period. During the select period of time, the AMC counts transition of a signal propagating through the AMC. Timing information based on the counted transitions is stored in a timing model in a m...

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Bibliographische Detailangaben

Hauptverfasser:	Nalamalpu, Ankireddy, Raghavan, Dhananjay, Subbareddy, Dheeraj, Iyer, Mahesh A
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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