MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM

MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM

The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source in...

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Hauptverfasser: Falk, Judith, Mannhardt, Joachim, Heisterkamp, Monika
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Falk, Judith
Mannhardt, Joachim
Heisterkamp, Monika
description The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source into a measuring region outside the probe housing and including the measuring medium, and to block measuring radiation from the measuring region. Via the optics, a receiving device detects measuring radiation and generates output data. An additional physical or chemical sensor is integrated into the probe housing and is designed to detect a measurand of the measuring medium and output measurement signals. An electronic measurement unit is configured to collect and process the output data of the receiving device and the measurement signals of the additional physical or chemical sensor.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019145888A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019145888A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019145888A13</originalsourceid><addsrcrecordid>eNrjZDDxdXUMDg3y9HNXcAwIcAxyDAkNVnDzD1Jw9HP0iYwCiysg1Pi6uniG-vIwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ0tDE1MLCwtHQ2PiVAEAdo4oiA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM</title><source>esp@cenet</source><creator>Falk, Judith ; Mannhardt, Joachim ; Heisterkamp, Monika</creator><creatorcontrib>Falk, Judith ; Mannhardt, Joachim ; Heisterkamp, Monika</creatorcontrib><description>The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source into a measuring region outside the probe housing and including the measuring medium, and to block measuring radiation from the measuring region. Via the optics, a receiving device detects measuring radiation and generates output data. An additional physical or chemical sensor is integrated into the probe housing and is designed to detect a measurand of the measuring medium and output measurement signals. An electronic measurement unit is configured to collect and process the output data of the receiving device and the measurement signals of the additional physical or chemical sensor.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190516&amp;DB=EPODOC&amp;CC=US&amp;NR=2019145888A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190516&amp;DB=EPODOC&amp;CC=US&amp;NR=2019145888A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Falk, Judith</creatorcontrib><creatorcontrib>Mannhardt, Joachim</creatorcontrib><creatorcontrib>Heisterkamp, Monika</creatorcontrib><title>MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM</title><description>The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source into a measuring region outside the probe housing and including the measuring medium, and to block measuring radiation from the measuring region. Via the optics, a receiving device detects measuring radiation and generates output data. An additional physical or chemical sensor is integrated into the probe housing and is designed to detect a measurand of the measuring medium and output measurement signals. An electronic measurement unit is configured to collect and process the output data of the receiving device and the measurement signals of the additional physical or chemical sensor.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDxdXUMDg3y9HNXcAwIcAxyDAkNVnDzD1Jw9HP0iYwCiysg1Pi6uniG-vIwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ0tDE1MLCwtHQ2PiVAEAdo4oiA</recordid><startdate>20190516</startdate><enddate>20190516</enddate><creator>Falk, Judith</creator><creator>Mannhardt, Joachim</creator><creator>Heisterkamp, Monika</creator><scope>EVB</scope></search><sort><creationdate>20190516</creationdate><title>MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM</title><author>Falk, Judith ; Mannhardt, Joachim ; Heisterkamp, Monika</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019145888A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Falk, Judith</creatorcontrib><creatorcontrib>Mannhardt, Joachim</creatorcontrib><creatorcontrib>Heisterkamp, Monika</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Falk, Judith</au><au>Mannhardt, Joachim</au><au>Heisterkamp, Monika</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM</title><date>2019-05-16</date><risdate>2019</risdate><abstract>The present disclosure relates to a measuring apparatus for analyzing a measuring medium. The measuring apparatus includes a probe housing, a radiation source, and coupling and decoupling optics. The optics have a measurement window in the probe housing to direct radiation of the radiation source into a measuring region outside the probe housing and including the measuring medium, and to block measuring radiation from the measuring region. Via the optics, a receiving device detects measuring radiation and generates output data. An additional physical or chemical sensor is integrated into the probe housing and is designed to detect a measurand of the measuring medium and output measurement signals. An electronic measurement unit is configured to collect and process the output data of the receiving device and the measurement signals of the additional physical or chemical sensor.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title MEASURING APPARATUS FOR ANALYZING A MEASURING MEDIUM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T17%3A28%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Falk,%20Judith&rft.date=2019-05-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019145888A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true