THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME

Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.

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Hauptverfasser: Chen, Yi-Hsiu, Ko, Jia-Ling, Liao, Ebin, Chiou, Wen-Chih, Shih, Hong-Ye
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Ko, Jia-Ling
Liao, Ebin
Chiou, Wen-Chih
Shih, Hong-Ye
description Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019139935A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019139935A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019139935A13</originalsourceid><addsrcrecordid>eNqNysEKAiEQgGEvHaJ6h4HOC5l08DjouAqpoON5WcJOUQvb-xNBD9DpP3z_VlT2hWiwIVKqISe8QkhMY0EmCyYU0wJD5dIMt0KAyUIk9tlCdhAxNYdfCWkE9gQVI-3F5j4_1n74dSeOjtj4oS-vqa_LfOvP_p5aPZ-klkprdUGp_rs-3-AxCQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME</title><source>esp@cenet</source><creator>Chen, Yi-Hsiu ; Ko, Jia-Ling ; Liao, Ebin ; Chiou, Wen-Chih ; Shih, Hong-Ye</creator><creatorcontrib>Chen, Yi-Hsiu ; Ko, Jia-Ling ; Liao, Ebin ; Chiou, Wen-Chih ; Shih, Hong-Ye</creatorcontrib><description>Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190509&amp;DB=EPODOC&amp;CC=US&amp;NR=2019139935A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190509&amp;DB=EPODOC&amp;CC=US&amp;NR=2019139935A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Chen, Yi-Hsiu</creatorcontrib><creatorcontrib>Ko, Jia-Ling</creatorcontrib><creatorcontrib>Liao, Ebin</creatorcontrib><creatorcontrib>Chiou, Wen-Chih</creatorcontrib><creatorcontrib>Shih, Hong-Ye</creatorcontrib><title>THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME</title><description>Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNysEKAiEQgGEvHaJ6h4HOC5l08DjouAqpoON5WcJOUQvb-xNBD9DpP3z_VlT2hWiwIVKqISe8QkhMY0EmCyYU0wJD5dIMt0KAyUIk9tlCdhAxNYdfCWkE9gQVI-3F5j4_1n74dSeOjtj4oS-vqa_LfOvP_p5aPZ-klkprdUGp_rs-3-AxCQ</recordid><startdate>20190509</startdate><enddate>20190509</enddate><creator>Chen, Yi-Hsiu</creator><creator>Ko, Jia-Ling</creator><creator>Liao, Ebin</creator><creator>Chiou, Wen-Chih</creator><creator>Shih, Hong-Ye</creator><scope>EVB</scope></search><sort><creationdate>20190509</creationdate><title>THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME</title><author>Chen, Yi-Hsiu ; Ko, Jia-Ling ; Liao, Ebin ; Chiou, Wen-Chih ; Shih, Hong-Ye</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019139935A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Chen, Yi-Hsiu</creatorcontrib><creatorcontrib>Ko, Jia-Ling</creatorcontrib><creatorcontrib>Liao, Ebin</creatorcontrib><creatorcontrib>Chiou, Wen-Chih</creatorcontrib><creatorcontrib>Shih, Hong-Ye</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chen, Yi-Hsiu</au><au>Ko, Jia-Ling</au><au>Liao, Ebin</au><au>Chiou, Wen-Chih</au><au>Shih, Hong-Ye</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME</title><date>2019-05-09</date><risdate>2019</risdate><abstract>Provided is a 3DIC structure includes a wafer, a die and a dielectric layer. The die is over and bonded to the wafer. The dielectric layer is over the wafer and aside the die, covering sidewalls of the die. A total thickness variation (TTV) of the die is less than 0.8 μm.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T13%3A50%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Chen,%20Yi-Hsiu&rft.date=2019-05-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019139935A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true