AUTOMATED DETECTION OF ARTIFACTS IN SCAN IMAGE

A method of analyzing an atomic force microscope image includes receiving data related to an atomic force microscope image, where the data includes at least a first channel of data and a second channel of data relating to a first and second image data type. The method also includes identifying at le...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Prakash, Ramprasath A, Chen, Zhiyu
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
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