MEASUREMENT-DATA COLLECTING APPARATUS AND COMPUTER PROGRAM

MEASUREMENT-DATA COLLECTING APPARATUS AND COMPUTER PROGRAM

A measurement-data collecting apparatus configured to read a measurement value from a measurement result displayed on a measurement tool and easily collect measurement data irrespective of whether the measurement tool is an analog measurement tool or a digital measurement tool is provided. The measu...

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1. Verfasser: ABE, Shinsaku
Format: Patent
Sprache:eng
Schlagworte:
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TARIFF METERING APPARATUS
TESTING
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creator ABE, Shinsaku
description A measurement-data collecting apparatus configured to read a measurement value from a measurement result displayed on a measurement tool and easily collect measurement data irrespective of whether the measurement tool is an analog measurement tool or a digital measurement tool is provided. The measurement-data collecting apparatus of the present invention includes an image capturing unit configured to capture image of an exterior view of a target measurement tool on which a measurement result is displayed and a measurement-value reading unit configured to read a measurement value from an exterior view image of the target measurement tool imaged by the image capturing unit.
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TARIFF METERING APPARATUS
TESTING
title MEASUREMENT-DATA COLLECTING APPARATUS AND COMPUTER PROGRAM
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