MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE

MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE

The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: FIFIELD, John A
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator FIFIELD, John A
description The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019108895A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019108895A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019108895A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAuDqL-w4GLDoVWEdoxxmsb8HLlekUylSJxEi3U_8fFD3B6y1smgYzUzoNip1CxAHtM1RFCK1yLITLnKwIhsQTYsba0ByNiAtycNmCZiD0QXxBsL4JeoeNeLK6TxWN8znHzc5VsK1TbpHF6D3Gexnt8xc_Qd4csL_OsKMqTyY__rS_XWDJt</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE</title><source>esp@cenet</source><creator>FIFIELD, John A</creator><creatorcontrib>FIFIELD, John A</creatorcontrib><description>The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.</description><language>eng</language><subject>INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190411&amp;DB=EPODOC&amp;CC=US&amp;NR=2019108895A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190411&amp;DB=EPODOC&amp;CC=US&amp;NR=2019108895A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FIFIELD, John A</creatorcontrib><title>MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE</title><description>The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.</description><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAuDqL-w4GLDoVWEdoxxmsb8HLlekUylSJxEi3U_8fFD3B6y1smgYzUzoNip1CxAHtM1RFCK1yLITLnKwIhsQTYsba0ByNiAtycNmCZiD0QXxBsL4JeoeNeLK6TxWN8znHzc5VsK1TbpHF6D3Gexnt8xc_Qd4csL_OsKMqTyY__rS_XWDJt</recordid><startdate>20190411</startdate><enddate>20190411</enddate><creator>FIFIELD, John A</creator><scope>EVB</scope></search><sort><creationdate>20190411</creationdate><title>MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE</title><author>FIFIELD, John A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019108895A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>FIFIELD, John A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FIFIELD, John A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE</title><date>2019-04-11</date><risdate>2019</risdate><abstract>The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2019108895A1
source esp@cenet
subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title MARGIN TEST FOR ONE-TIME PROGRAMMABLE MEMORY (OTPM) ARRAY WITH COMMON MODE CURRENT SOURCE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T05%3A15%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FIFIELD,%20John%20A&rft.date=2019-04-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019108895A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true