Method of Removing an Etch Mask

An embodiment method includes forming a patterned etch mask over a target layer and patterning the target layer using the patterned etch mask as a mask to form a patterned target layer. The method further includes performing a first cleaning process on the patterned etch mask and the patterned targe...

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Hauptverfasser: Huang, Ping-Jung, Chu, Chun-Han, Yen, Bi-Ming, Chuo, Tsung-Min, Shih, Jui-Ming, Chen, Nai-Chia
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creator Huang, Ping-Jung
Chu, Chun-Han
Yen, Bi-Ming
Chuo, Tsung-Min
Shih, Jui-Ming
Chen, Nai-Chia
description An embodiment method includes forming a patterned etch mask over a target layer and patterning the target layer using the patterned etch mask as a mask to form a patterned target layer. The method further includes performing a first cleaning process on the patterned etch mask and the patterned target layer, the first cleaning process including a first solution. The method additionally includes performing a second cleaning process to remove the patterned etch mask and form an exposed patterned target layer, the second cleaning process including a second solution. The method also includes performing a third cleaning process on the exposed patterned target layer, and performing a fourth cleaning process on the exposed patterned target layer, the fourth cleaning process comprising the first solution.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2019097052A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2019097052A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2019097052A13</originalsourceid><addsrcrecordid>eNrjZJD3TS3JyE9RyE9TCErNzS_LzEtXSMxTcC1JzlDwTSzO5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGlgaW5gamRo6GxsSpAgBhFCT8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method of Removing an Etch Mask</title><source>esp@cenet</source><creator>Huang, Ping-Jung ; Chu, Chun-Han ; Yen, Bi-Ming ; Chuo, Tsung-Min ; Shih, Jui-Ming ; Chen, Nai-Chia</creator><creatorcontrib>Huang, Ping-Jung ; Chu, Chun-Han ; Yen, Bi-Ming ; Chuo, Tsung-Min ; Shih, Jui-Ming ; Chen, Nai-Chia</creatorcontrib><description>An embodiment method includes forming a patterned etch mask over a target layer and patterning the target layer using the patterned etch mask as a mask to form a patterned target layer. The method further includes performing a first cleaning process on the patterned etch mask and the patterned target layer, the first cleaning process including a first solution. The method additionally includes performing a second cleaning process to remove the patterned etch mask and form an exposed patterned target layer, the second cleaning process including a second solution. The method also includes performing a third cleaning process on the exposed patterned target layer, and performing a fourth cleaning process on the exposed patterned target layer, the fourth cleaning process comprising the first solution.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190328&amp;DB=EPODOC&amp;CC=US&amp;NR=2019097052A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190328&amp;DB=EPODOC&amp;CC=US&amp;NR=2019097052A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Huang, Ping-Jung</creatorcontrib><creatorcontrib>Chu, Chun-Han</creatorcontrib><creatorcontrib>Yen, Bi-Ming</creatorcontrib><creatorcontrib>Chuo, Tsung-Min</creatorcontrib><creatorcontrib>Shih, Jui-Ming</creatorcontrib><creatorcontrib>Chen, Nai-Chia</creatorcontrib><title>Method of Removing an Etch Mask</title><description>An embodiment method includes forming a patterned etch mask over a target layer and patterning the target layer using the patterned etch mask as a mask to form a patterned target layer. The method further includes performing a first cleaning process on the patterned etch mask and the patterned target layer, the first cleaning process including a first solution. The method additionally includes performing a second cleaning process to remove the patterned etch mask and form an exposed patterned target layer, the second cleaning process including a second solution. The method also includes performing a third cleaning process on the exposed patterned target layer, and performing a fourth cleaning process on the exposed patterned target layer, the fourth cleaning process comprising the first solution.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD3TS3JyE9RyE9TCErNzS_LzEtXSMxTcC1JzlDwTSzO5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGlgaW5gamRo6GxsSpAgBhFCT8</recordid><startdate>20190328</startdate><enddate>20190328</enddate><creator>Huang, Ping-Jung</creator><creator>Chu, Chun-Han</creator><creator>Yen, Bi-Ming</creator><creator>Chuo, Tsung-Min</creator><creator>Shih, Jui-Ming</creator><creator>Chen, Nai-Chia</creator><scope>EVB</scope></search><sort><creationdate>20190328</creationdate><title>Method of Removing an Etch Mask</title><author>Huang, Ping-Jung ; Chu, Chun-Han ; Yen, Bi-Ming ; Chuo, Tsung-Min ; Shih, Jui-Ming ; Chen, Nai-Chia</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2019097052A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Huang, Ping-Jung</creatorcontrib><creatorcontrib>Chu, Chun-Han</creatorcontrib><creatorcontrib>Yen, Bi-Ming</creatorcontrib><creatorcontrib>Chuo, Tsung-Min</creatorcontrib><creatorcontrib>Shih, Jui-Ming</creatorcontrib><creatorcontrib>Chen, Nai-Chia</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Huang, Ping-Jung</au><au>Chu, Chun-Han</au><au>Yen, Bi-Ming</au><au>Chuo, Tsung-Min</au><au>Shih, Jui-Ming</au><au>Chen, Nai-Chia</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of Removing an Etch Mask</title><date>2019-03-28</date><risdate>2019</risdate><abstract>An embodiment method includes forming a patterned etch mask over a target layer and patterning the target layer using the patterned etch mask as a mask to form a patterned target layer. The method further includes performing a first cleaning process on the patterned etch mask and the patterned target layer, the first cleaning process including a first solution. The method additionally includes performing a second cleaning process to remove the patterned etch mask and form an exposed patterned target layer, the second cleaning process including a second solution. The method also includes performing a third cleaning process on the exposed patterned target layer, and performing a fourth cleaning process on the exposed patterned target layer, the fourth cleaning process comprising the first solution.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Method of Removing an Etch Mask
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T12%3A59%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Huang,%20Ping-Jung&rft.date=2019-03-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2019097052A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true