PARALLEL TEST STRUCTURE

An exemplary apparatus includes a testing module connected to, and providing a test voltage to, an integrated circuit containing devices under test. The testing module performs a time-dependent dielectric breakdown (TDDB) test on the devices under test. A decoder is connected to the devices under te...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Justison, Patrick R, Filippi, JR., Ronald G, Christiansen, Cathryn J, Cao, Linjun, Kumar, Anil, Song, Yuncheng, Choi, Seungman, Shen, Tian, Yeap, Kong Boon
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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