OPERATING PARAMETER OFFSETS IN SOLID STATE MEMORY DEVICES

Systems and methods are described for generating location-based read voltage offsets in a data storage device. Optimal read voltage thresholds vary across memory elements of a device. However, data storage devices are often limited in the number of read voltage thresholds that can be maintained in t...

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Bibliographische Detailangaben
Hauptverfasser: Reusswig, Philip David, Yang, Nian Niles, Navon, Ariel, Rom, Rami, Kirshenbaum, Roi, Goldenberg, Idan, Bazarsky, Alexander, Inbar, Karin
Format: Patent
Sprache:eng
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