STORAGE SYSTEM AND METHOD FOR HANDLING OVERHEATING OF THE STORAGE SYSTEM
A storage system and method for handling overheating of the storage system are disclosed. The method comprises determining whether a temperature sensed by a temperature sensor is above a first threshold temperature; and in response to determining that the temperature sensed by the temperature sensor...
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creator | Yang, Nian Niles Erez, Eran Vaysman, Dmitry Guo, Zelei |
description | A storage system and method for handling overheating of the storage system are disclosed. The method comprises determining whether a temperature sensed by a temperature sensor is above a first threshold temperature; and in response to determining that the temperature sensed by the temperature sensor is above the first threshold temperature, lowering a voltage supplied by a power supply to one or more components in the storage system comprising transistors, wherein lowering the voltage supplied to the one or more components reduces temperature by reducing leakage current of the transistors. |
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The method comprises determining whether a temperature sensed by a temperature sensor is above a first threshold temperature; and in response to determining that the temperature sensed by the temperature sensor is above the first threshold temperature, lowering a voltage supplied by a power supply to one or more components in the storage system comprising transistors, wherein lowering the voltage supplied to the one or more components reduces temperature by reducing leakage current of the transistors.</description><language>eng</language><subject>INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181101&DB=EPODOC&CC=US&NR=2018315483A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181101&DB=EPODOC&CC=US&NR=2018315483A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Yang, Nian Niles</creatorcontrib><creatorcontrib>Erez, Eran</creatorcontrib><creatorcontrib>Vaysman, Dmitry</creatorcontrib><creatorcontrib>Guo, Zelei</creatorcontrib><title>STORAGE SYSTEM AND METHOD FOR HANDLING OVERHEATING OF THE STORAGE SYSTEM</title><description>A storage system and method for handling overheating of the storage system are disclosed. The method comprises determining whether a temperature sensed by a temperature sensor is above a first threshold temperature; and in response to determining that the temperature sensed by the temperature sensor is above the first threshold temperature, lowering a voltage supplied by a power supply to one or more components in the storage system comprising transistors, wherein lowering the voltage supplied to the one or more components reduces temperature by reducing leakage current of the transistors.</description><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAIDvEPcnR3VQiODA5x9VVw9HNR8HUN8fB3UXDzD1LwAPJ9PP3cFfzDXIM8XB1DwGw3hRAPoA4UnTwMrGmJOcWpvFCam0HZzTXE2UM3tSA_PrW4IDE5NS-1JD402MjA0MLY0NTEwtjR0Jg4VQC6Ry3P</recordid><startdate>20181101</startdate><enddate>20181101</enddate><creator>Yang, Nian Niles</creator><creator>Erez, Eran</creator><creator>Vaysman, Dmitry</creator><creator>Guo, Zelei</creator><scope>EVB</scope></search><sort><creationdate>20181101</creationdate><title>STORAGE SYSTEM AND METHOD FOR HANDLING OVERHEATING OF THE STORAGE SYSTEM</title><author>Yang, Nian Niles ; Erez, Eran ; Vaysman, Dmitry ; Guo, Zelei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018315483A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>Yang, Nian Niles</creatorcontrib><creatorcontrib>Erez, Eran</creatorcontrib><creatorcontrib>Vaysman, Dmitry</creatorcontrib><creatorcontrib>Guo, Zelei</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yang, Nian Niles</au><au>Erez, Eran</au><au>Vaysman, Dmitry</au><au>Guo, Zelei</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>STORAGE SYSTEM AND METHOD FOR HANDLING OVERHEATING OF THE STORAGE SYSTEM</title><date>2018-11-01</date><risdate>2018</risdate><abstract>A storage system and method for handling overheating of the storage system are disclosed. The method comprises determining whether a temperature sensed by a temperature sensor is above a first threshold temperature; and in response to determining that the temperature sensed by the temperature sensor is above the first threshold temperature, lowering a voltage supplied by a power supply to one or more components in the storage system comprising transistors, wherein lowering the voltage supplied to the one or more components reduces temperature by reducing leakage current of the transistors.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INFORMATION STORAGE PHYSICS STATIC STORES |
title | STORAGE SYSTEM AND METHOD FOR HANDLING OVERHEATING OF THE STORAGE SYSTEM |
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