Accessing Error Statistics from Dram Memories Having Integrated Error Correction

In described examples, a memory module includes a memory array with a primary access port coupled to the memory array. Error correction logic is coupled to the memory array. A statistics register is coupled to the error correction logic. A secondary access port is coupled to the statistics register...

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1. Verfasser: Kothamasu, Siva Srinivas
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description In described examples, a memory module includes a memory array with a primary access port coupled to the memory array. Error correction logic is coupled to the memory array. A statistics register is coupled to the error correction logic. A secondary access port is coupled to the statistics register to allow access to the statistics register by an external device without using the primary interface.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018314590A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018314590A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018314590A13</originalsourceid><addsrcrecordid>eNqNy7EKwkAMgOFbHER9h4Cz0LMKOpZaqYMgVOcSrmk5sJeSBJ9fhD6A0798_9I9ihBINaYBKhEWaAwtqsWg0AuPcBEc4U4jSySFGj8_ektGg6BRN18li1CwyGntFj2-lTZzV257rZ5lvaOJW9IJAyWy9tXsM3_K_eF4zgqf_6e-VuU4EQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Accessing Error Statistics from Dram Memories Having Integrated Error Correction</title><source>esp@cenet</source><creator>Kothamasu, Siva Srinivas</creator><creatorcontrib>Kothamasu, Siva Srinivas</creatorcontrib><description>In described examples, a memory module includes a memory array with a primary access port coupled to the memory array. Error correction logic is coupled to the memory array. A statistics register is coupled to the error correction logic. A secondary access port is coupled to the statistics register to allow access to the statistics register by an external device without using the primary interface.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20181101&amp;DB=EPODOC&amp;CC=US&amp;NR=2018314590A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20181101&amp;DB=EPODOC&amp;CC=US&amp;NR=2018314590A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kothamasu, Siva Srinivas</creatorcontrib><title>Accessing Error Statistics from Dram Memories Having Integrated Error Correction</title><description>In described examples, a memory module includes a memory array with a primary access port coupled to the memory array. Error correction logic is coupled to the memory array. A statistics register is coupled to the error correction logic. A secondary access port is coupled to the statistics register to allow access to the statistics register by an external device without using the primary interface.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNy7EKwkAMgOFbHER9h4Cz0LMKOpZaqYMgVOcSrmk5sJeSBJ9fhD6A0798_9I9ihBINaYBKhEWaAwtqsWg0AuPcBEc4U4jSySFGj8_ektGg6BRN18li1CwyGntFj2-lTZzV257rZ5lvaOJW9IJAyWy9tXsM3_K_eF4zgqf_6e-VuU4EQ</recordid><startdate>20181101</startdate><enddate>20181101</enddate><creator>Kothamasu, Siva Srinivas</creator><scope>EVB</scope></search><sort><creationdate>20181101</creationdate><title>Accessing Error Statistics from Dram Memories Having Integrated Error Correction</title><author>Kothamasu, Siva Srinivas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018314590A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>Kothamasu, Siva Srinivas</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kothamasu, Siva Srinivas</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Accessing Error Statistics from Dram Memories Having Integrated Error Correction</title><date>2018-11-01</date><risdate>2018</risdate><abstract>In described examples, a memory module includes a memory array with a primary access port coupled to the memory array. Error correction logic is coupled to the memory array. A statistics register is coupled to the error correction logic. A secondary access port is coupled to the statistics register to allow access to the statistics register by an external device without using the primary interface.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
title Accessing Error Statistics from Dram Memories Having Integrated Error Correction
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T16%3A50%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kothamasu,%20Siva%20Srinivas&rft.date=2018-11-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2018314590A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true