METROLOGY SYSTEM FOR POSITIONING ASSEMBLIES

A method and apparatus for maintaining a selected configuration for a structure. Metrology data for a support system is received while the support system holds the structure. A determination is made as to whether a current configuration of the structure is within selected tolerances of the selected...

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Bibliographische Detailangaben
Hauptverfasser: Day, Dan Dresskell, Cobb, James M, Reid, Eric M, DesJardien, Matthew Ray, Munk, Clayton Lynn, Best, Steven A
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method and apparatus for maintaining a selected configuration for a structure. Metrology data for a support system is received while the support system holds the structure. A determination is made as to whether a current configuration of the structure is within selected tolerances of the selected configuration for the structure based on the metrology data. The support system is moved to move the structure held by the support system into the selected configuration in response to a determination that the current configuration of the structure is not within the selected tolerances of the selected configuration for the structure.