METHOD OF FABRICATING PATTERN STRUCTURE

A method includes forming mask patterns spaced apart from each other by at least one opening on an etch target layer, filling the opening with a block copolymer material including first and second polymer blocks of different properties, and annealing the block copolymer material to form first patter...

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Bibliographische Detailangaben
Hauptverfasser: YI, Shiyong, MAEDA, SHIGENOBU, PARK, Jeong Ju, KIM, Eunsung, KIM, Hyunwoo
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method includes forming mask patterns spaced apart from each other by at least one opening on an etch target layer, filling the opening with a block copolymer material including first and second polymer blocks of different properties, and annealing the block copolymer material to form first patterns and second patterns, the first patterns in contact with facing sidewalls of adjacent ones of the mask patterns, respectively, and at least one of the second patterns between the first patterns. The first patterns include the first polymer blocks and the second patterns include the second polymer blocks.