Manufacturing Quality Improvement Through Statistical Root Cause Analysis Using Convolution Neural Networks

A quality improvement method for an image sensor array includes collecting in-line optical inspection data of the image sensor, collecting end of line electrical data of the image sensor, creating defect maps and obtaining x-y coordinates of the optical inspection data and the electrical data, corre...

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Bibliographische Detailangaben

Hauptverfasser:	O'Hern, JR., Paul R, Crocco, Jerome David
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS
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