Automated FTIR Spectrometer

A system for placing a sample at a predefined measurement location for measuring an optical property of that sample. The apparatus includes a measurement platform for supporting the sample at the measurement location, the measurement platform having an orifice therein beneath the measurement locatio...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Martineau, Philip Maurice, Smith, Luke Michael, Rose, Peter Stanley, Cann, Brad, Fisher, David, Abelaira, Juan
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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