METHOD AND APPARATUS FOR MEASURING EXCHANGE STIFFNESS AT A PATTERNED DEVICE LEVEL

A method and apparatus determine an exchange stiffness of a free layer residing in a magnetic junction. The method includes performing spin torque ferromagnetic resonance (ST-FMR) measurements for the magnetic junction. The ST-FMR measurements indicate characteristic frequencies corresponding to spi...

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Hauptverfasser:	Voznyuk, Volodymyr, Apalkov, Dmytro, Krivorotov, Ilya, Sha, Chengcen, Beach, Robert
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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