METHOD AND APPARATUS FOR MEASURING EXCHANGE STIFFNESS AT A PATTERNED DEVICE LEVEL

METHOD AND APPARATUS FOR MEASURING EXCHANGE STIFFNESS AT A PATTERNED DEVICE LEVEL

A method and apparatus determine an exchange stiffness of a free layer residing in a magnetic junction. The method includes performing spin torque ferromagnetic resonance (ST-FMR) measurements for the magnetic junction. The ST-FMR measurements indicate characteristic frequencies corresponding to spi...

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Hauptverfasser: Voznyuk, Volodymyr, Apalkov, Dmytro, Krivorotov, Ilya, Sha, Chengcen, Beach, Robert
Format: Patent
Sprache:eng
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BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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creator Voznyuk, Volodymyr
Apalkov, Dmytro
Krivorotov, Ilya
Sha, Chengcen
Beach, Robert
description A method and apparatus determine an exchange stiffness of a free layer residing in a magnetic junction. The method includes performing spin torque ferromagnetic resonance (ST-FMR) measurements for the magnetic junction. The ST-FMR measurements indicate characteristic frequencies corresponding to spin wave modes in the free layer. The method also includes calculating the exchange stiffness of the free layer based upon the plurality of characteristic frequencies. In some embodiments, the magnetic junction resides on a wafer including other magnetic junctions for a device. The magnetic junctions may be arranged as a magnetic memory. The magnetic junction undergoing ST-FMR has a different aspect ratio than the magnetic junctions.
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title METHOD AND APPARATUS FOR MEASURING EXCHANGE STIFFNESS AT A PATTERNED DEVICE LEVEL
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