THERMAL TREATMENT APPARATUS, THERMAL TREATMENT METHOD, AND NON-TRANSITORY COMPUTER STORAGE MEDIUM
A thermal treatment apparatus including a hot plate which heats a substrate mounted thereon, in a treatment chamber including a lid body covering a surface to be treated of the substrate mounted on the hot plate, the thermal treatment apparatus includes: a control unit which controls at least a temp...
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creator | SEKO, Hiroshi SEKIMOTO, Eiichi SAIKUSA, Takeshi |
description | A thermal treatment apparatus including a hot plate which heats a substrate mounted thereon, in a treatment chamber including a lid body covering a surface to be treated of the substrate mounted on the hot plate, the thermal treatment apparatus includes: a control unit which controls at least a temperature of the hot plate, and a temperature measuring unit which measures a temperature of the lid body, wherein the control unit is configured to perform, when a set temperature of the hot plate is changed, correction of a heating amount by the hot plate for obtaining the set temperature after change, based on the temperature of the lid body measured by the temperature measuring unit. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018182611A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018182611A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018182611A13</originalsourceid><addsrcrecordid>eNqNij0LwjAUALM4iPofHri2YCpI10fzNAXzQfIydCpB4iRaqP8fO7i5OB3H3Vpk1hQMXoEDIRuyDOg9BuQUK_iNhlg7VQFaBdbZmgPa2LMLA3TO-MQUIC6KF1pe1SezFat7fsxl9-VG7M_Ena7L9BrLPOVbeZb3mGJzkK1sm5OUKI__XR_A0jUT</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>THERMAL TREATMENT APPARATUS, THERMAL TREATMENT METHOD, AND NON-TRANSITORY COMPUTER STORAGE MEDIUM</title><source>esp@cenet</source><creator>SEKO, Hiroshi ; SEKIMOTO, Eiichi ; SAIKUSA, Takeshi</creator><creatorcontrib>SEKO, Hiroshi ; SEKIMOTO, Eiichi ; SAIKUSA, Takeshi</creatorcontrib><description>A thermal treatment apparatus including a hot plate which heats a substrate mounted thereon, in a treatment chamber including a lid body covering a surface to be treated of the substrate mounted on the hot plate, the thermal treatment apparatus includes: a control unit which controls at least a temperature of the hot plate, and a temperature measuring unit which measures a temperature of the lid body, wherein the control unit is configured to perform, when a set temperature of the hot plate is changed, correction of a heating amount by the hot plate for obtaining the set temperature after change, based on the temperature of the lid body measured by the temperature measuring unit.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180628&DB=EPODOC&CC=US&NR=2018182611A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180628&DB=EPODOC&CC=US&NR=2018182611A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SEKO, Hiroshi</creatorcontrib><creatorcontrib>SEKIMOTO, Eiichi</creatorcontrib><creatorcontrib>SAIKUSA, Takeshi</creatorcontrib><title>THERMAL TREATMENT APPARATUS, THERMAL TREATMENT METHOD, AND NON-TRANSITORY COMPUTER STORAGE MEDIUM</title><description>A thermal treatment apparatus including a hot plate which heats a substrate mounted thereon, in a treatment chamber including a lid body covering a surface to be treated of the substrate mounted on the hot plate, the thermal treatment apparatus includes: a control unit which controls at least a temperature of the hot plate, and a temperature measuring unit which measures a temperature of the lid body, wherein the control unit is configured to perform, when a set temperature of the hot plate is changed, correction of a heating amount by the hot plate for obtaining the set temperature after change, based on the temperature of the lid body measured by the temperature measuring unit.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNij0LwjAUALM4iPofHri2YCpI10fzNAXzQfIydCpB4iRaqP8fO7i5OB3H3Vpk1hQMXoEDIRuyDOg9BuQUK_iNhlg7VQFaBdbZmgPa2LMLA3TO-MQUIC6KF1pe1SezFat7fsxl9-VG7M_Ena7L9BrLPOVbeZb3mGJzkK1sm5OUKI__XR_A0jUT</recordid><startdate>20180628</startdate><enddate>20180628</enddate><creator>SEKO, Hiroshi</creator><creator>SEKIMOTO, Eiichi</creator><creator>SAIKUSA, Takeshi</creator><scope>EVB</scope></search><sort><creationdate>20180628</creationdate><title>THERMAL TREATMENT APPARATUS, THERMAL TREATMENT METHOD, AND NON-TRANSITORY COMPUTER STORAGE MEDIUM</title><author>SEKO, Hiroshi ; SEKIMOTO, Eiichi ; SAIKUSA, Takeshi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018182611A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>SEKO, Hiroshi</creatorcontrib><creatorcontrib>SEKIMOTO, Eiichi</creatorcontrib><creatorcontrib>SAIKUSA, Takeshi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SEKO, Hiroshi</au><au>SEKIMOTO, Eiichi</au><au>SAIKUSA, Takeshi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>THERMAL TREATMENT APPARATUS, THERMAL TREATMENT METHOD, AND NON-TRANSITORY COMPUTER STORAGE MEDIUM</title><date>2018-06-28</date><risdate>2018</risdate><abstract>A thermal treatment apparatus including a hot plate which heats a substrate mounted thereon, in a treatment chamber including a lid body covering a surface to be treated of the substrate mounted on the hot plate, the thermal treatment apparatus includes: a control unit which controls at least a temperature of the hot plate, and a temperature measuring unit which measures a temperature of the lid body, wherein the control unit is configured to perform, when a set temperature of the hot plate is changed, correction of a heating amount by the hot plate for obtaining the set temperature after change, based on the temperature of the lid body measured by the temperature measuring unit.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
title | THERMAL TREATMENT APPARATUS, THERMAL TREATMENT METHOD, AND NON-TRANSITORY COMPUTER STORAGE MEDIUM |
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