INSPECTION SUPPORT APPARATUS AND CONTROL METHOD THEREOF, INSPECTION SYSTEM, AND CONTROL PROGRAM
A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlati...
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creator | NAKAI, Takuya FUNAMOTO, Akihiro TOMITA, Kohei TAKEUCHI, Tsuyoshi SANO, Akihiko |
description | A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlation table and determines the influence of the other types of defects on the inspection result. Information pertaining to the determined influence is outputted via an output unit. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018167029A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018167029A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018167029A13</originalsourceid><addsrcrecordid>eNrjZIj39AsOcHUO8fT3UwgODQjwDwpRcAwIcAxyDAkNVnD0c1Fw9vcLCfL3UfB1DfHwd1EI8XANcvV301FA1hgZHOLqq4OiPCDI3z3I0ZeHgTUtMac4lRdKczMou7mGOHvophbkx6cWFyQmp-allsSHBhsZGFoYmpkbGFk6GhoTpwoAZYk0kw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION SUPPORT APPARATUS AND CONTROL METHOD THEREOF, INSPECTION SYSTEM, AND CONTROL PROGRAM</title><source>esp@cenet</source><creator>NAKAI, Takuya ; FUNAMOTO, Akihiro ; TOMITA, Kohei ; TAKEUCHI, Tsuyoshi ; SANO, Akihiko</creator><creatorcontrib>NAKAI, Takuya ; FUNAMOTO, Akihiro ; TOMITA, Kohei ; TAKEUCHI, Tsuyoshi ; SANO, Akihiko</creatorcontrib><description>A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlation table and determines the influence of the other types of defects on the inspection result. Information pertaining to the determined influence is outputted via an output unit.</description><language>eng</language><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; ELECTRICITY ; GENERATION ; GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180614&DB=EPODOC&CC=US&NR=2018167029A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180614&DB=EPODOC&CC=US&NR=2018167029A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKAI, Takuya</creatorcontrib><creatorcontrib>FUNAMOTO, Akihiro</creatorcontrib><creatorcontrib>TOMITA, Kohei</creatorcontrib><creatorcontrib>TAKEUCHI, Tsuyoshi</creatorcontrib><creatorcontrib>SANO, Akihiko</creatorcontrib><title>INSPECTION SUPPORT APPARATUS AND CONTROL METHOD THEREOF, INSPECTION SYSTEM, AND CONTROL PROGRAM</title><description>A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlation table and determines the influence of the other types of defects on the inspection result. Information pertaining to the determined influence is outputted via an output unit.</description><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIj39AsOcHUO8fT3UwgODQjwDwpRcAwIcAxyDAkNVnD0c1Fw9vcLCfL3UfB1DfHwd1EI8XANcvV301FA1hgZHOLqq4OiPCDI3z3I0ZeHgTUtMac4lRdKczMou7mGOHvophbkx6cWFyQmp-allsSHBhsZGFoYmpkbGFk6GhoTpwoAZYk0kw</recordid><startdate>20180614</startdate><enddate>20180614</enddate><creator>NAKAI, Takuya</creator><creator>FUNAMOTO, Akihiro</creator><creator>TOMITA, Kohei</creator><creator>TAKEUCHI, Tsuyoshi</creator><creator>SANO, Akihiko</creator><scope>EVB</scope></search><sort><creationdate>20180614</creationdate><title>INSPECTION SUPPORT APPARATUS AND CONTROL METHOD THEREOF, INSPECTION SYSTEM, AND CONTROL PROGRAM</title><author>NAKAI, Takuya ; FUNAMOTO, Akihiro ; TOMITA, Kohei ; TAKEUCHI, Tsuyoshi ; SANO, Akihiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018167029A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAI, Takuya</creatorcontrib><creatorcontrib>FUNAMOTO, Akihiro</creatorcontrib><creatorcontrib>TOMITA, Kohei</creatorcontrib><creatorcontrib>TAKEUCHI, Tsuyoshi</creatorcontrib><creatorcontrib>SANO, Akihiko</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAI, Takuya</au><au>FUNAMOTO, Akihiro</au><au>TOMITA, Kohei</au><au>TAKEUCHI, Tsuyoshi</au><au>SANO, Akihiko</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION SUPPORT APPARATUS AND CONTROL METHOD THEREOF, INSPECTION SYSTEM, AND CONTROL PROGRAM</title><date>2018-06-14</date><risdate>2018</risdate><abstract>A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlation table and determines the influence of the other types of defects on the inspection result. Information pertaining to the determined influence is outputted via an output unit.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES |
title | INSPECTION SUPPORT APPARATUS AND CONTROL METHOD THEREOF, INSPECTION SYSTEM, AND CONTROL PROGRAM |
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