TAMPER DETECTOR

TAMPER DETECTOR

One example discloses a tamper detection device, comprising: a detection circuit, configured to be powered by a near-field-communication (NFC) signal and store a status of a detection element; wherein the detection circuit is configured to set the status to undisturbed in response to an undisturbed...

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Hauptverfasser: van Lammeren, Joop Petrus Maria, Verhoeven, Henri, Moonen, Oswald
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator van Lammeren, Joop Petrus Maria
Verhoeven, Henri
Moonen, Oswald
description One example discloses a tamper detection device, comprising: a detection circuit, configured to be powered by a near-field-communication (NFC) signal and store a status of a detection element; wherein the detection circuit is configured to set the status to undisturbed in response to an undisturbed state of the detection element; wherein the detection circuit is configured to set the status to disturbed in response to a disturbed state of the detection element; and wherein the detection circuit is configured to electrically report the detection element status in response to a wireless query signal.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2018156854A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2018156854A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2018156854A13</originalsourceid><addsrcrecordid>eNrjZOAPcfQNcA1ScHENcXUO8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoYWhqZmFqYmjobGxKkCAF4aHj0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TAMPER DETECTOR</title><source>esp@cenet</source><creator>van Lammeren, Joop Petrus Maria ; Verhoeven, Henri ; Moonen, Oswald</creator><creatorcontrib>van Lammeren, Joop Petrus Maria ; Verhoeven, Henri ; Moonen, Oswald</creatorcontrib><description>One example discloses a tamper detection device, comprising: a detection circuit, configured to be powered by a near-field-communication (NFC) signal and store a status of a detection element; wherein the detection circuit is configured to set the status to undisturbed in response to an undisturbed state of the detection element; wherein the detection circuit is configured to set the status to disturbed in response to a disturbed state of the detection element; and wherein the detection circuit is configured to electrically report the detection element status in response to a wireless query signal.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180607&amp;DB=EPODOC&amp;CC=US&amp;NR=2018156854A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180607&amp;DB=EPODOC&amp;CC=US&amp;NR=2018156854A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>van Lammeren, Joop Petrus Maria</creatorcontrib><creatorcontrib>Verhoeven, Henri</creatorcontrib><creatorcontrib>Moonen, Oswald</creatorcontrib><title>TAMPER DETECTOR</title><description>One example discloses a tamper detection device, comprising: a detection circuit, configured to be powered by a near-field-communication (NFC) signal and store a status of a detection element; wherein the detection circuit is configured to set the status to undisturbed in response to an undisturbed state of the detection element; wherein the detection circuit is configured to set the status to disturbed in response to a disturbed state of the detection element; and wherein the detection circuit is configured to electrically report the detection element status in response to a wireless query signal.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAPcfQNcA1ScHENcXUO8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBoYWhqZmFqYmjobGxKkCAF4aHj0</recordid><startdate>20180607</startdate><enddate>20180607</enddate><creator>van Lammeren, Joop Petrus Maria</creator><creator>Verhoeven, Henri</creator><creator>Moonen, Oswald</creator><scope>EVB</scope></search><sort><creationdate>20180607</creationdate><title>TAMPER DETECTOR</title><author>van Lammeren, Joop Petrus Maria ; Verhoeven, Henri ; Moonen, Oswald</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2018156854A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>van Lammeren, Joop Petrus Maria</creatorcontrib><creatorcontrib>Verhoeven, Henri</creatorcontrib><creatorcontrib>Moonen, Oswald</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>van Lammeren, Joop Petrus Maria</au><au>Verhoeven, Henri</au><au>Moonen, Oswald</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TAMPER DETECTOR</title><date>2018-06-07</date><risdate>2018</risdate><abstract>One example discloses a tamper detection device, comprising: a detection circuit, configured to be powered by a near-field-communication (NFC) signal and store a status of a detection element; wherein the detection circuit is configured to set the status to undisturbed in response to an undisturbed state of the detection element; wherein the detection circuit is configured to set the status to disturbed in response to a disturbed state of the detection element; and wherein the detection circuit is configured to electrically report the detection element status in response to a wireless query signal.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title TAMPER DETECTOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T06%3A41%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=van%20Lammeren,%20Joop%20Petrus%20Maria&rft.date=2018-06-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2018156854A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true